Laboratory for research of detectors and semiconductor devices

In charge of the lab: Prof. Arie Ruzin
Equipment: Atomic force microscope with electrical measurements options (including Torsion TUNA); Laplace-DLTS (deep level transient spectroscopy); setups for electrical noise characterization; setups for characterization of bonded devices and bare chips; system for detector spectroscopy characterization; X-ray generator with micro-beam focusing.
Main research fields: Study of radiation induced defects in semiconductor devices, study of novel semiconductor materials such as silicon-germanium with diffused lithium atoms, research of contact formation dynamics and nano-contacts, study of infra-red detectors, study of ONO (SiO₂-Si₃N₄-SiO₂) memory devices.