CONFERENCES

    Papers submitted to professional journals
17. A. Ruzin, G. Casse, M. Glaser, F. Lemeilleur, J. Mtheson, S. Watts, A. Zanet, “Radiation effects in silicon detectors processed on carbon and oxygen rich substrates”, Submitted to Materials Science in Semiconductor Processing.
18. A. Ruzin, “Recent results from the RD48 (ROSE) collaboration”, to be published in  Nucl. Instr. and Meth.
 

C. Papers presented at professional conferences
1. A. Ruzin, J. Gorelik, G. Asa and Y. Nemirovsky ,"Electrical properties of CdZnTe crystals for radiation detectors ", Annual conference of the Israeli Assoc. for Crystal Growth (1995).
2. A. Ruzin, J. Gorelik and Y. Nemirovsky, "Mobility-lifetime product of CdTe/CdZnTe crystals from charge collection efficiency of X-ray detectors", Presented at the 1995  IEEE convention in Tel Aviv. IEEE Proc. (1995).
3. A. Ruzin, A. Bezinger, Y. Nemirovsky and G. Shaviv, "X-ray detectors and integrated electronics for X-ray imaging for Astronomy", SPIE Proc., Vol.1971, 266-275(1992).
4.    A. Ruzin, G. Asa and Y. Nemirovsky, “Electronic noise in CdZnTe Gamma-ray spectrometers”, presented at the 19th IEEE convention in Jerusalem November 96.
5.     A. Ruzin and Y. Nemirovsky, “Performance study of CdZnTe spectrometers”, presented at the 7th Pisa meeting on advanced detectors “Frontier detectors for frontier physics” , in La Biodola, Isola d’Elba, Italy, May 97.
6. G. Casse, M. Glaser, E. Grigoriev, F. Lemeilleur, A. Ruzin, B. Sopko, A. Taffard, “Impact of mesa and planar processes on radiation hardness of Si  detectors”, Nuovo Cimento, Vol. 112 A, N. 1-2, 1999.
7. A. Ruzin, G. Casse and F. Lemeilleur, “Impurity, Resistivity, Noise and Crystallography measurements of processed and  irradiated FZ silicon”, The 3rd workshop of ROSE collaboration – RD48, Desy – Hamburg, Germany, February 1998.
8. G. Casse, M. Glaser, F. Lemeilleur, A. Ruzin, “Influence of oxygen concentration on radiation hardness of silicon detectors”, The 3rd workshop of ROSE collaboration – RD48, Desy – Hamburg, Germany, February 1998
9. A. Ruzin, G. Casse and F. Lemeilleur and M. Glaser, “Studies of Radiation Hardness of Oxygen Enriched Silicon Detectors”, presented at “The 2nd International Conference on Radiation Effects on Semiconductor Materials, Detectors and Devices”, Firenze Italy March, 1998.
10. A. Ruzin, G. Casse, F. Lemeilleur, M. Glaser, “Radiation Hardness of Silicon Detectors Enriched with Oxygen by Different Methods”, 24th International Conference of the Physics of Semiconductors (ICPS 24), Jerusalem August 1998.
11. A. Ruzin, G. Casse, M. Glaser, R. Talamonti, A. Zanet, F. Lemeilleur, “Radiation Hardness of Silicon Detectors Manufactured on Epitaxial Material and FZ Bulk Enriched with Oxygen, Carbon, Tin and Platinum”, 6th International Conference on Advanced Technology and Particle Physics Villa Olmo, Como, Italy October 1998.
12. F. Lemeilleur, G. Casse, M. Glaser, A. Ruzin, R. Talamonti, A. Zanet, S. Watts, “Latest Experimental Results on Radiation Tolerance of Various Non-Standard Silicon Substrates”, international conference Vertex 98, Santorini, Greece, October 1998.
13. A. Ruzin, G. Casse, M. Glaser, M. Kuhnke, F. Lemeilleur, J. Mtheson, A. Vasilescu, A. Zanet “Results of radiation hardness of diodes processed from various silicon materials”, The 4th workshop of ROSE collaboration – RD48, CERN – Geneva, Switzerland, December 1998.
14. A. Ruzin, G. Casse, M. Glaser, F. Lemeilleur, J. Mtheson, S. Watts, A. Zanet, “Radiation effects in silicon detectors processed on carbon and oxygen rich substrates”, The first workshop of European Network on Defect Engineering of Advanced Semiconductor Devices (ENDEASD), Santorini, Greece, April 99.
15. *A. Ruzin, “Recent results from the RD48 (ROSE) collaboration”, Invited talk. The 8th International Workshop on Vertex Detectors VERTEX'99, 20-25 June 1999 on the island Texel in the Netherlands.
16. A. Ruzin, M. Glaser, F. Lemeilleur, A. Zanet, “Radiation hardness of silicon detectors processed on various oxygen-enriched wafers”, 4th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors, June 23-25, 1999, Florence, Italy.
17. A. Ruzin, M. Glaser, F. Lemeilleur, A. Zanet, “Radiation hardness of silicon detectors manufactured on oxygen- and carbon-enriched material”, to be presented at SPIE’s 44th Annual Meeting, 18-23 July, Colorado, USA.
18. G. Asa, A. Ruzin*, C. Jacobson, G. Shaviv, Y. Nemirovsky, “Micro-Satellite gamma ray spectroscopy experiment”, to be presented at SPIE’s 44th Annual Meeting, 18-23 July, Colorado, USA.