Journal of Microwave Power and Electromagnetic Energy (JMPEE)
TITLE	Microwave Test Chamber for Measuring the Relative Permittivity of Thin Dielectric Films [PDF]
AUTHORS	H. P. S. Ahluwalia, W. M. Boerner and M. A. K. Hamid 1971 6 1 15-24
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Abstract A microwave test chamber for measuring the dielectric constant of thin films on substrates using the cavity perturbation technique is described. Special emphasis is placed on testing biochemical phospho-lipid membranes, whose properties resemble those of living tissues; therefore, their rupture by microwave irradiation may determine microwave safety levels. A novel feature of the test chamber is the use of a resonant iris to enhance the field in the aperture where the sample is suspended. It is shown that significant shift in the center frequency and change in the Q factor of the X-band cavity are obtained for films of thicknesses as low as a few hundred microns.