Journal of Microwave Power
and Electromagnetic Energy (JMPEE) |
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TITLE |
Electromagnetic Techniques
for Nondestructive Testing of Dielectric Materials:
Diffraction Tomography [PDF] |
AUTHORS |
M. Bramanti and 1992 27 4 233-240 |
YEAR |
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VOLUME |
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ISSUE |
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PAGES |
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Abstract The paper first addresses
the basic theory of inverse scattering and gives a brief overview of the
scattering based imaging techniques proposed over the last decades. A
particular back scattering far field technique [Mensaetal,
et al 1983], which appears to be promising for industrial nondestructive
testing owing to its simplicity of implementation, is then presented. The
authors' experimental implementation of this technique is described and some
preliminary results are given to show the capability of the method in
discriminating inhomogeneities in dielectric
materials. Finally, the applicability of the technique to real-world
situations is discussed. The extensive bibliography is intended to assist the
interested readers in acquiring a deeper knowledge of both the theory and the
state of the art in microwave imaging. Key Words: Nondestructive testing, Permittivity measurements, Diffraction
tomography. |