Journal of Microwave Power and Electromagnetic Energy (JMPEE)

 

TITLE

Design of a New High-Temperature Dielectrometer System [PDF]

AUTHORS

W. Tinga and W. Xi

1993

28

2

93-103

YEAR

VOLUME

ISSUE

PAGES

 

Abstract

Important engineering design criteria and measurements constraints of a high-speed, automatic, high-temperature dielectrometer including a coaxial re-entrant cavity with a hollow center conductor are described.  By virtue of selective and localized microwave heating, a part of a small sample can be rapidly heated to its melting point while keeping the test chamber at room temperature.  Significant high temperature dielectric measurement problems are thereby minimized for the 915 and 2450 MHz ISM bands.  The system can acquire dielectric data of a ceramic material from room temperature to 1500oC is less than one minute.

         

Key Words:

High temperature, Dielectrometer, Dielectric constant, Permittivity, Ceramics, Design