Journal of Microwave Power
and Electromagnetic Energy (JMPEE) |
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TITLE |
Design of a New High-Temperature
Dielectrometer System [PDF] |
AUTHORS |
W. Tinga and W. Xi 1993 28 2 93-103 |
YEAR |
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VOLUME |
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ISSUE |
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PAGES |
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Abstract Important engineering design criteria and
measurements constraints of a high-speed, automatic, high-temperature dielectrometer including a coaxial re-entrant cavity with
a hollow center conductor are described. By virtue of selective and localized
microwave heating, a part of a small sample can be rapidly heated to its
melting point while keeping the test chamber at room temperature. Significant high temperature dielectric
measurement problems are thereby minimized for the 915 and 2450 MHz ISM
bands. The system can acquire
dielectric data of a ceramic material from room temperature to 1500oC
is less than one minute. Key Words: High temperature, Dielectrometer, Dielectric constant, Permittivity,
Ceramics, Design |