Journal of Microwave Power
and Electromagnetic Energy (JMPEE) |
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TITLE |
A Computer
Program for Short-Circuited Waveguide Dielectric-Properties Measurements on
High- or Low-Loss Materials [PDF] |
AUTHORS |
S.O.
Nelson, C. W. Schlaphoff and L. E. Stetson 1973 8 1 13-22 |
YEAR |
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VOLUME |
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ISSUE |
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PAGES |
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Abstract A general computer program is described
for precisely calculating dielectric properties of high- or low-loss
materials from short-circuited coaxial, cylindrical, or rectangular waveguide
measurements on samples in contact with the short-circuit termination.
Slotted-section measurements are corrected for the influence of the slot on
the propagation constant of the waveguide. Corrections are included for wall
losses in the waveguide, and differences between measurements in vacuum and
in air are also taken into account. Three sets of possible values for the
relative dielectric constant and loss factor, loss tangent, and conductivity
are printed out corresponding to three solutions of the complex
transcendental equation. Data for up to fifty samples are stored, and a
summary table includes the set of dielectric properties corresponding most
closely to the estimated dielectric constant for each sample |