Arie Ruzin, D. Sc.
Department of Physical Electronics, Faculty of
Engineering
69978 Tel
WELCOME TO OUR LABORATORY PAGE !!
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Current-Voltage (I-V) characterization as a
function of temperature with four biasing sources up to 1100 Volts each and
current resolution of 1 |
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Capacitance-Voltage (C-V) profiling as a
function of temperature and frequency, up to 800V. |
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Noise Power Spectral Density (PSD) characterization
for both, current and voltage signals (with low noise voltage and
trans-impedance amplifiers). |
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Multi-channel X-ray spectroscopy
characterization, including charge sensitive pre-amplifiers, shaping
amplifiers, MCA (Multi Channel Analyzer), pulser. |
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· Setup
for Transient Current Technique (TCT), with a 1060nm laser. |
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Computer Simulation stations for device
simulation with commercial ISE TCAD software. |
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Deep Level Transient Spectroscopy (DLTS), and
Laplace DLTS setup for trap characterization |
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Atomic Force Microscope (AFM) with electrical
measurements – Veeco Dimension 3100. |
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· Dr. Sergey Marunko – Lab Engineer
· Ilia Torchinsky – AFM Engineer
· D. Sc.
Students: Juri Guskov
· M. Sc.
Students: Janna Glick, Igal Yaroslavsky
Open positions:
In the following fields of research: CdZnTe detectors for x- and gamma-rays, silicon detectors for soft x-rays, computer simulations of various detectors (with existing and self-written software), Atomic Force Microscopy (AFM) measurements of various detectors, radiation damage to detectors and VLSI electronics, VLSI design and testing of front-end electronic circuits (fabrication will be performed elsewhere).
A variety of interesting projects is offered to fine students: Design and LabView programming of automatic electronic measurements; Design, simulation and testing of analog and digital VLSI circuits; Computer simulation of novel semiconductor devices by a commercial simulation software; Hardware and software design for student laboratory upgrades, etc.
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comments or suggestions, email me at